Scanning Probe Microscopes (SPMs)

from NanoMagnetics Instruments the leader in the manufacture and marketing of Scanning Probe Microscopes (SPMs) and measurement systems for various fields of science and technology.

This microscope family, (includes Atomic Force Microscopes AFM); is used to measure various surface properties of materials. They are complementary to the traditional optical and electron microscopes (EM) and have extensive applications beyond simple surface topography measurements. Properties such as carrier density, charge distribution, binding energy, electrochemical properties, surface magnetic field profile, hardness and spectroscopic measurements from simple IV to force distance and Nano mechanical properties can be studied with these microscopes. It is also possible to inspect samples under various atmospheric conditions, especially needed for biological applications.

The range of products for ambient temperature applications are ezAFM, ezSTM (Scanning Tunnelling Microscope), hpAFM, AFM+, Ambient AFM and RT-SHPM (Scanning Hall Probe). Models are also available for extremely low temperatures (<10mK) and high magnetic fields (>20T) as may be used for superconducting material studies.

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