Online Event – Low Voltage High Contrast Imaging

Online Event – Low Voltage High Contrast Imaging

Learn more about the LVEM5 and LVEM25 electron microscopes direct from the experts.


Delong  explores the benefits of low voltage-high contrast imaging in both material science and life science applications. This, combined with the small size and ease of use of our instruments is certainly the reason that benchtop electron microscopes from Delong are poised to propel your research to new levels of excellence.

Schedule your Zoom Call


Featured Application Note

Nanoparticle Size Measurement Techniques
This report will present some of the commonly used measurement techniques for measuring the size of particles, including nanoparticles, colloidal particles, and nanoparticles. Highlights of the strengths of each instrumentation technique and the best approaches for sample preparation methods will be presented. The metrology, or fundamental measurement science, behind each technique will be discussed to inform on the strengths and limitations of what is actually being measured.

View Application Note…